OLYMPUS Cantilevers

OLYMPUS Micro Cantilever AC 160TS

Olympus cantilever with tetrahedral tip for standard applications using oscillating cantilever AFM techniques like TappingMode(TM) or non-contact mode. This cantilever covers a broad range of applications e.g. in polymer science (phase imaging), material science, optical disc industry (CDs), semiconductor and numerous other scientific fields.

Main features:

• Resonance frequency 300 kHz, spring constant 42 N/m.
• Tip radius < 10 nm for highest resolution imaging.
• Olympus Tetra tip with almost symmetrical side angles with respect to the substrate yielding comparable aspect ratio in all directions of the image. This makes special orientation of the sample with respect to the cantilever unnecessary, in contrast to many other commercially available tips with asymmetric side angles.
• Tip is located exactly at the cantilever end allowing for precise optical pre-positioning of the tip with respect to features of interest on the sample.
• Aluminum reflex coating on the cantilevers back side increases reflectivity and minimizes optical interferences on reflective samples..